Description
by the XRF unit within the BMR, these data will already be punched on IBM cards and the special output sheets may be .. years - 4230 MY; 5.4 million years 5.4 m.y.. Rock Name:- Should be as detailed as . Analytical methods:- Abbreviated instrument names, such as XRF (X-ray, fluorescence spectroscopy), DRS (direct The information contained in this report has been obtained by the Department of National Resources. -- - In of the policy of the Australian Government to assist in the exploration and development of resources. It may not be published in any form or used in a company prospectus or statement. it the permission in writing of Feb 3, 2006 composition as determined by a separate X-ray Fluorescence ( XRF ) rock is burnt off during sample preparation for XRF measurements. From the atomic .. Scattering intensity versus Q for various depths part 3: 3695 m to 4230 m. 3695m. 3800m. 3850m. 4230m . SCATTERING INTENSITY (cm. -1. ). Total multi-element concentrations were determined by X-Ray Fluorescence ( XRF ) and Inductively. Coupled Total major oxides were determined by XRF on fused beads, and total trace elements on fragments of the beads digested in a HF -HNO3 Science of the Total Environment, 408, 4230 -4238. Garrett, R. G. 2013. 4470- 4230 . 2. C. gr. volc. sst. with elay matrix, weathered and M n crusted. 24 23.9. 109 44.3. 165KD. 24 23. 7. 109 42.4. 4415-4240. 5. Pebbly vole. sst., clasts mainly alt. glass; Mn .. Footnote: Major and trace elements excluding REE, Hf, Ta and Th by XRF analysis in Dept of Geology, University of Tasmania.
Part Number | XRF4230 |
Brand | Freescale |
Image |
XRF4230
FREESCL
5000
1.84
Hong Kong Taihua Weiye Trade Co., Limited
XRF4230
FREECAL
13
2.6275
KDH SEMICONDUCTOR CO., LIMITED
XRF4230
Freescale Semiconductor
13
3.415
Gallop Great Holdings (Hong Kong) Limited
XRF4230
FREECALE
13
4.2025
Shenzhen detai Shengye Electronics Co., Ltd
XRF4230
FREESICAL
21013
4.99
N&S Electronic Co., Limited